.svg){kind=logo}
MULTIPLE DEFERRED STATE SAMPLING INSPECTION PLAN FOR VARIABLES BASED ON ONE-SIDED PROCESS CAPABILITY INDEX
Keywords:
conditional sampling plan, multiple deferred state sampling plan, process capability index, operating characteristic function, average sample numberDOI:
https://doi.org/10.17654/0972086322011Abstract
The multiple deferred state sampling inspection plan, a distinct special purpose sampling plan, inspects the quality of subsequent lot in addition to the present lot to reach a decision on acceptance or non-acceptance of lots of manufactured products. The process of capability indices is one of the statistical methodologies in statistical process control, extensively employed to assess the capability of the production process in accordance with its manufacturing specifications. This article suggests a variable multiple deferred state sampling inspection plan for unilateral specification based on one-sided process capability index. The suggested plan is developed with respect to the exact sampling distribution of the estimated index. The proposed plan parameters are achieved by minimizing the average sample number for specific capability requirements assuring the producer and consumer conservation. The importance of the proposed plan is discussed.
Received: June 14, 2022
Accepted: July 25, 2022
References
M. Aslam, C. H. Yen and C. H. Jun, Variable repetitive group sampling plans with process loss consideration, J. Stat. Comput. Simul. 81 (2011), 1417-1432.
Y. M. Chou and D. B. Owen, On the distributions of the estimated process capability indices, Comm. Statist. Theory Methods 18(2) (1989), 4549-4560.
S. Geetha and Mathew Raichel, Design of multiple deferred state sampling inspection plan for variables, Seventh International Conference on Statistics for Twenty-first Century-2021, University of Kerala, Trivandrum, 15-19 December, 2021.
K. Govindaraju and K. Subramani, Selection of multiple deferred (dependent) state sampling plans for given acceptable quality level and limiting quality level, J. Appl. Stat. 20(3) (1993), 423-428. http://dx.doi.org/10.1080/02664769300000041.
V. E. Kane, Process capability indices, Journal of Quality Technology 18(1) (1986), 41-52. https://doi.org/10.1080/00224065.1986.11978984.
G. J. Lieberman and G. J. Resnikoff, Sampling plans for inspection by variables, J. Amer. Statist. Assoc. 50 (1955), 457-516.
D. B. Owen, Variables sampling plans based on the normal distribution, Technometrics 9 (1967), 417-423.
W. L. Pearn and K. S. Chen, One-sided capability indices CPU and CPL: decision making with sample information, International Journal of Quality Reliability Management 19(3) (2002), 221-245.
W. L. Pearn and C. W. Wu, Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives, Omega - International Journal of Management Science 34(1) (2006), 90-101.
W. L. Pearn and C. W. Wu, Variables sampling plans with PPM fraction of defectives and process loss consideration, Journal of the Operational Research Society 57(4) (2006), 450-459.
W. L. Pearn and C. W. Wu, An effective decision making method for product acceptance, Omega - International Journal of Management Science 35(1) (2007), 12-21.
E. G. Schilling, Acceptance Sampling in Quality Control, New York, Marcel Dekker, Inc., 1982.
V. Soundararajan and R. Vijayaraghavan, Construction and selection of multiple dependent (deferred) state sampling plan, J. Appl. Stat. 17(3) (1990), 397-409. http://dx.doi.org/10.1080/02664769000000012.
G. Srinivasa Rao, Muhammad Aslam and Chi-Hyuck Jun, A variable sampling plan using generalized multiple dependent state based on a one-sided process capability index, Comm. Statist. Simulation Comput. 50 (2021), 2666-2677. https://doi.org/10.1080/03610918.2019.1612431.
R. Vaerst, A procedure to construct multiple deferred state sampling plan, Methods of Operations Research 37 (1982), 477-485.
A. W. Wortham and R. C. Baker, Multiple deferred state sampling inspection, International Journal of Production Research 14(6) (1976), 719-731. http://dx.doi.org/10.1080/00207547608956391.
C. W. Wu, Amy H. I. Lee and Chien Chih-Chieh Chang, A variables multiple dependent state sampling plan based on a one-sided capability index, Quality Engineering 29 (2017), 719-729. http://dx.doi.org/10.1080/08982112.2017.1288913.
C. H. Yen and C. H. Chang, Designing variables sampling plans with process loss consideration, Comm. Statist. Simulation Comput. 38 (2009), 1579-1591.
C. H. Yen, C. H. Chang and M. Aslam, Repetitive variable acceptance sampling plan for one-sided specification, J. Stat. Comput. Simul. 85(6) (2015), 1102-1116. http://dx.doi.org/10.1080/00949655.2013.862791.
C. H. Yen, C. H. Chang, M. Aslam and C. H. Jun, Multiple dependent state repetitive sampling plans based on one-sided process capability indices, Comm. Statist. Theory Methods 47 (2018), 1403-1412. http://dx.doi.org/10.1080/03610926.2017.1321121.
Downloads
Published
Issue
Section
License
Copyright (c) 2022 Pushpa Publishing House, Prayagraj, India
This work is licensed under a Creative Commons Attribution 4.0 International License.
____________________________
Attribution: Credit Pusha Publishing House as the original publisher, including title and author(s) if applicable.
Non-Commercial Use: For non-commercial purposes only. No commercial activities without explicit permission.
No Derivatives: Modifying or creating derivative works not allowed without written permission.
Contact Pusha Publishing House for more info or permissions.
